• DocumentCode
    2905573
  • Title

    Study on Leak Rate Formula and Criterion for Helium Mass Spectrometer Fine Leak Test

  • Author

    Geng-lin, Wang ; Li-yan, Wang ; Li-Jun, Dong ; Zheng, Huang

  • Author_Institution
    Beijing Keytone Electron. Relay Corp., Beijing
  • fYear
    2007
  • fDate
    14-17 Aug. 2007
  • Firstpage
    1
  • Lastpage
    11
  • Abstract
    In the course of analyzing and deducing leak rate formula of fine leak test measurement of helium mass spectrometer, equivalent standard leak rate L is replaced with standard helium leak rate LHe . Helium gas exchange time constant zetaHe is cited, and the contents of typical gases inside hermetic cavity is calculated. It shows that after properly handling the measured leak rate deviation, a series of formulas of the paper can be used to perform engineering calculation on the process of gas exchange. zetaHes are calculated corresponding to leak rate criterion under various test conditions of current Chinese national military standards and US military standards in fine leak test of helium mass spectrometer, so real LHe is preferable to virtual L. Additionally, it is noted that zetaHe is the characteristic parameter to measure the relative hermeticity, and especially, most leak rate criterions in current military standards cannot guarantee meeting the requirement of internal vapor content, so by analyzing the improvement in the standards and existing hermeticity levels, it is evident that there still exists the necessity for the standards to be further improved.
  • Keywords
    helium; leak detection; mass spectrometers; He; fine leak test; helium gas exchange time constant; helium mass spectrometer; hermetic cavity; leak rate formula; Argon; Current measurement; Electronic equipment testing; Gases; Helium; Hermetic seals; Mass spectroscopy; Measurement standards; Military standards; Performance evaluation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology, 2007. ICEPT 2007. 8th International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-1-4244-1392-8
  • Electronic_ISBN
    978-1-4244-1392-8
  • Type

    conf

  • DOI
    10.1109/ICEPT.2007.4441537
  • Filename
    4441537