Title :
Predicting the Reliability of Power Electronic Modules
Author :
Bailey, C. ; Lu, H. ; Tilford, T.
Author_Institution :
Univ. of Greenwich, London
Abstract :
This paper discusses the reliability of an IGBT power electronics module. This work is part of a major UK funded initiative into the design, packaging and reliability of power electronic modules. The predictive methodology combines numerical modeling techniques with experimentation and accelerated testing to identify failure modes and mechanisms for these type of power electronic module structures. The paper details results for solder joint failure substrate solder. Finite element method modeling techniques have been used to predict the stress and strain distribution within the module structures. Together with accelerated life testing, these results have provided a failure model for these joints which has been used to predict reliability of a rail traction application.
Keywords :
electronics packaging; finite element analysis; insulated gate bipolar transistors; life testing; numerical analysis; reliability; solders; IGBT; finite element method modeling techniques; life testing; numerical modeling techniques; power electronic modules reliability; predictive methodology; rail traction application; solder joint failure substrate solder; stress-strain distribution; Capacitive sensors; Electronics packaging; Finite element methods; Insulated gate bipolar transistors; Life estimation; Numerical models; Power electronics; Predictive models; Soldering; Stress;
Conference_Titel :
Electronic Packaging Technology, 2007. ICEPT 2007. 8th International Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4244-1392-8
Electronic_ISBN :
978-1-4244-1392-8
DOI :
10.1109/ICEPT.2007.4441543