DocumentCode
2905695
Title
Oxidation failure of Lead Frame Copper alloys with Surface Electroplated Pure Cu
Author
Chen, Xi ; Hu, Anmin ; Li, Ming ; Shen, Hong ; Mao, Dali
Author_Institution
Shanghai Jiao Tong Univ., Shanghai
fYear
2007
fDate
14-17 Aug. 2007
Firstpage
1
Lastpage
5
Abstract
Influence of surface electroplated pure copper on oxidation failure of lead frame copper alloys for IC package were investigate. Pure copper layer will benefit the diffusion of copper ion, so the thickness of copper oxide films increase but the velocity of CuO formation decrease and the oxidation only occurs at pure copper layer. As electroplating pure copper layer on copper alloy exceed a critical thickness, surface electroplating treatment can improve copper alloy´s resistance against oxidation failure greatly. The oxide film structure of copper alloys is CuO/Cu2O/Cu substrate, after electroplate treated, and the oxide film structure change to CuO (no or trace)/Cu2O/Cu. The oxide films with only Cu2O have higher adhesion strengths.
Keywords
copper; copper compounds; electroplating; integrated circuit packaging; oxidation; semiconductor device packaging; CuO-Cu2O-Cu; integrated circuit package; lead frame copper alloys; oxidation failure; oxidation resistance; pure copper; surface electroplating; Adhesives; Coatings; Copper alloys; Lead compounds; Materials science and technology; Oxidation; Semiconductor device packaging; Semiconductor films; Surface resistance; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Packaging Technology, 2007. ICEPT 2007. 8th International Conference on
Conference_Location
Shanghai
Print_ISBN
978-1-4244-1392-8
Electronic_ISBN
978-1-4244-1392-8
Type
conf
DOI
10.1109/ICEPT.2007.4441545
Filename
4441545
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