Built-in parametric test for controlled impedance I/Os

Author

Haulin, T.

Author_Institution

Ericsson Telecom AB, Stockholm

fYear

1997

fDate

27 Apr-1 May 1997

Firstpage

123

Lastpage

128

Abstract

A test method for functional and parametric test of I/Os has been developed. This method allows I/Os to be tested in parallel by use of a common DC supply instead of individual tester channels and pin electronics. Full DC parametrics on inputs and outputs, and full speed AC tests, can be performed on lower cost ATE. Both single-ended and differential signal I/Os are handled. Differential measurements are taken on differential I/Os. This test method works on I/Os using short circuit proof drivers with controlled impedance

Keywords

VLSI; automatic test equipment; automatic testing; boundary scan testing; built-in self test; driver circuits; fault diagnosis; logic testing; B9 test method; bidirectional I/O; boundary scan; built-in parametric test; contact test; controlled impedance I/Os; diagnostic tests; differential receivers; differential signal I/Os; differential transmitters; full DC parametrics; full speed AC tests; functional test; high speed test logic; lower cost ATE; narrow pulse test; short circuit proof drivers; single-ended signal I/Os; static tests; Circuit testing; Driver circuits; Electronic equipment testing; Fixtures; Impedance; Low voltage; Packaging; Performance evaluation; Probes; Rails;

fLanguage

English

Publisher

ieee

Conference_Titel

VLSI Test Symposium, 1997., 15th IEEE

Conference_Location

Monterey, CA

ISSN

1093-0167

Print_ISBN

0-8186-7810-0

Type

conf

DOI

10.1109/VTEST.1997.599461

Filename

599461