• DocumentCode
    2906366
  • Title

    A Hold Friendly Flip-Flop For Area Recovery

  • Author

    Ahmadi, Rubil

  • Author_Institution
    Adv. Micro Devices Inc, Toronto, Ont.
  • fYear
    2007
  • fDate
    27-30 May 2007
  • Firstpage
    3768
  • Lastpage
    3771
  • Abstract
    In this paper a new family of scan flip-flops is introduced whose scan pin hold characteristic has improved while data pin timing is left intact. This characteristic helps to alleviate scan chain hold problem while meeting the maximum frequency in data path. This solution can reduce the number of buffers inserted in the scan chain to fix hold violations. The new flip-flop can save up to 29% area as compared to the usage of normal flip-flop combined with hold-fixing buffers.
  • Keywords
    buffer circuits; flip-flops; area recovery; buffers; data pin timing; hold friendly flip-flop; scan chain; scan flip-flops; scan pin hold characteristic; Application specific integrated circuits; Circuit testing; Clocks; Digital integrated circuits; Energy consumption; Flip-flops; Frequency; Logic testing; Pipelines; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2007. ISCAS 2007. IEEE International Symposium on
  • Conference_Location
    New Orleans, LA
  • Print_ISBN
    1-4244-0920-9
  • Electronic_ISBN
    1-4244-0921-7
  • Type

    conf

  • DOI
    10.1109/ISCAS.2007.378781
  • Filename
    4253501