DocumentCode
2906366
Title
A Hold Friendly Flip-Flop For Area Recovery
Author
Ahmadi, Rubil
Author_Institution
Adv. Micro Devices Inc, Toronto, Ont.
fYear
2007
fDate
27-30 May 2007
Firstpage
3768
Lastpage
3771
Abstract
In this paper a new family of scan flip-flops is introduced whose scan pin hold characteristic has improved while data pin timing is left intact. This characteristic helps to alleviate scan chain hold problem while meeting the maximum frequency in data path. This solution can reduce the number of buffers inserted in the scan chain to fix hold violations. The new flip-flop can save up to 29% area as compared to the usage of normal flip-flop combined with hold-fixing buffers.
Keywords
buffer circuits; flip-flops; area recovery; buffers; data pin timing; hold friendly flip-flop; scan chain; scan flip-flops; scan pin hold characteristic; Application specific integrated circuits; Circuit testing; Clocks; Digital integrated circuits; Energy consumption; Flip-flops; Frequency; Logic testing; Pipelines; Timing;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 2007. ISCAS 2007. IEEE International Symposium on
Conference_Location
New Orleans, LA
Print_ISBN
1-4244-0920-9
Electronic_ISBN
1-4244-0921-7
Type
conf
DOI
10.1109/ISCAS.2007.378781
Filename
4253501
Link To Document