Title :
Testing Reversible 1D Arrays for Molecular QCA
Author :
Ma, X. ; Huang, J. ; Metra, C. ; Lombardi, F.
Author_Institution :
Dept. of Electr. & Comput. Eng., Northeastern Univ.
Abstract :
Reversible logic design is a well-known paradigm in digital computation. While an extensive literature exists on its mathematical characterization, little work has been reported on its possible technological basis. In this paper, a quantum-dot cellular automata (QCA) is investigated for testable implementations of reversible logic. Two new reversible gates (denoted as QCA1 and QCA2) are proposed. These gates are compared (in terms of delay, area and logic synthesis) with other reversible gates (such as Toffoli and Fredkin) for QCA implementation. As the bijective nature of reversibility makes testing significantly easier than in the general case, testing of the reversible gates is pursued in detail. C-testability of a 1D array is investigated for single cell fault as well multiple cell faults. Defect analysis of the reversible gates is pursued under a single missing/additional cell assumption
Keywords :
cellular automata; logic design; molecular electronics; quantum dots; quantum gates; C-testability; defect analysis; digital computation; logic synthesis; molecular QCA; multiple cell faults; quantum dot cellular automata; reversible 1D arrays testing; reversible gates; reversible logic design; single cell fault; Circuit faults; Circuit testing; Clocks; Energy dissipation; Inverters; Logic circuits; Logic design; Logic devices; Logic testing; Quantum cellular automata; QCA; Reversible computing; emerging technologies.;
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 2006. DFT '06. 21st IEEE International Symposium on
Conference_Location :
Arlington, VA
Print_ISBN :
0-7695-2706-X
DOI :
10.1109/DFT.2006.63
