Title :
A Novel Methodology for Functional Test Data Compression
Author :
Hashempour, Hamidreza ; Lombardi, Fabrizio
Author_Institution :
Dept. of ECE, Northeastern Univ., Boston, MA
Abstract :
This paper presents a novel approach for compressing functional test data in automatic test equipment (ATE). A practical technique is presented for 2 dimensional (2D) reordering of test data in which additionally to test vector reordering, column reordering is also applied. An ATE based approach to extract the original test vectors from the 2D ordered data is presented. The advantage of the approach is substantiated using the figure of merit of entropy for the 2D ordered test data of ISCAS benchmark circuits
Keywords :
automatic test equipment; data compression; 2D ordered test data; 2D reordering; ATE; automatic test equipment; column reordering; functional test data compression; vector reordering; Automatic test equipment; Automatic testing; Circuit testing; Costs; Data mining; Entropy; Semiconductor device manufacture; System testing; System-on-a-chip; Test data compression;
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 2006. DFT '06. 21st IEEE International Symposium on
Conference_Location :
Arlington, VA
Print_ISBN :
0-7695-2706-X
