• DocumentCode
    2906596
  • Title

    Quantifying the impact of current-sensing on interconnect delay trends

  • Author

    Maheshwari, Atul ; Srinivasaraghavan, Srividya ; Burleson, Wayne

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Massachusetts Univ., Amherst, MA, USA
  • fYear
    2002
  • fDate
    25-28 Sept. 2002
  • Firstpage
    461
  • Lastpage
    465
  • Abstract
    This work tries to compare the performance of traditionally used repeaters with a recently proposed differential current-sensing signaling technique for present and future technologies. Several technology scaling models have been proposed for device and interconnect scaling. For this study, the Berkeley predictive technology model, the semiconductor industry association model and the Sylvester-Keutzer model are used. Percentage of chip reached in a clock cycle is used as a metric. This allows a better understanding of the impact of these circuit techniques on architecture and floorplanning issues. Results show that differential current-sensing signaling is significantly faster than repeaters for most of the scaling theories and hence allows for a larger coverage of chip in a clock cycle. If clock rates are scaled more aggressively (as they have been in the past), the gains for current-sensing can be even more significant. Any new circuit style presents design challenges and potential power and area tradeoffs. Despite these challenges, and as a motivation to overcome them, this paper shows a methodology and preliminary results that indicate opportunities for novel interconnect circuits.
  • Keywords
    circuit simulation; delays; integrated circuit design; integrated circuit interconnections; integrated circuit modelling; logic design; logic simulation; repeaters; Berkeley predictive technology model; Sylvester-Keutzer model; chip coverage; clock cycle chip reached percentage; clock rates; device/interconnect scaling; differential current-sensing signaling techniques; floorplanning; interconnect delay trends; power/area tradeoffs; repeaters; semiconductor industry association model; technology scaling models; Circuit testing; Clocks; Delay estimation; Frequency; Guidelines; Integrated circuit interconnections; Integrated circuit technology; Predictive models; Repeaters; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ASIC/SOC Conference, 2002. 15th Annual IEEE International
  • Print_ISBN
    0-7803-7494-0
  • Type

    conf

  • DOI
    10.1109/ASIC.2002.1158103
  • Filename
    1158103