DocumentCode
2906596
Title
Quantifying the impact of current-sensing on interconnect delay trends
Author
Maheshwari, Atul ; Srinivasaraghavan, Srividya ; Burleson, Wayne
Author_Institution
Dept. of Electr. & Comput. Eng., Massachusetts Univ., Amherst, MA, USA
fYear
2002
fDate
25-28 Sept. 2002
Firstpage
461
Lastpage
465
Abstract
This work tries to compare the performance of traditionally used repeaters with a recently proposed differential current-sensing signaling technique for present and future technologies. Several technology scaling models have been proposed for device and interconnect scaling. For this study, the Berkeley predictive technology model, the semiconductor industry association model and the Sylvester-Keutzer model are used. Percentage of chip reached in a clock cycle is used as a metric. This allows a better understanding of the impact of these circuit techniques on architecture and floorplanning issues. Results show that differential current-sensing signaling is significantly faster than repeaters for most of the scaling theories and hence allows for a larger coverage of chip in a clock cycle. If clock rates are scaled more aggressively (as they have been in the past), the gains for current-sensing can be even more significant. Any new circuit style presents design challenges and potential power and area tradeoffs. Despite these challenges, and as a motivation to overcome them, this paper shows a methodology and preliminary results that indicate opportunities for novel interconnect circuits.
Keywords
circuit simulation; delays; integrated circuit design; integrated circuit interconnections; integrated circuit modelling; logic design; logic simulation; repeaters; Berkeley predictive technology model; Sylvester-Keutzer model; chip coverage; clock cycle chip reached percentage; clock rates; device/interconnect scaling; differential current-sensing signaling techniques; floorplanning; interconnect delay trends; power/area tradeoffs; repeaters; semiconductor industry association model; technology scaling models; Circuit testing; Clocks; Delay estimation; Frequency; Guidelines; Integrated circuit interconnections; Integrated circuit technology; Predictive models; Repeaters; Threshold voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
ASIC/SOC Conference, 2002. 15th Annual IEEE International
Print_ISBN
0-7803-7494-0
Type
conf
DOI
10.1109/ASIC.2002.1158103
Filename
1158103
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