DocumentCode :
2906636
Title :
Low-Density Triple-Erasure Correcting Codes for Dependable Distributed Storage Systems
Author :
Ohde, Hiroyuki ; Kaneko, Haruhiko ; Fujiwara, Eiji
Author_Institution :
Graduate Sch. of Inf. Sci. & Eng., Tokyo Inst. of Technol.
fYear :
2006
fDate :
Oct. 2006
Firstpage :
175
Lastpage :
183
Abstract :
Unlike conventional disk array systems such as redundant arrays of independent disks (RAID), distributed storage systems do not require a central controller for a group of disk drive. This decentralized structure avoids a single point of failure as well as bottlenecks in data transfers. The structure should therefore be suitable for dependable, large-scale storage systems. This paper proposes new distributed erasure correction algorithms suitable for the distributed storage systems, and also proposes new classes of triple-erasure correcting codes designed using combinatorial theory such as the Steiner triple system. The authors briefly evaluate the proposed coding method in terms of the number of check disks, the number of disk accesses, and the mean time to data loss (MTTDL). The evaluation demonstrates that the proposed codes require fewer check disks than those in disk mirroring. The proposed erasure correction algorithms also require fewer disk accesses than erasure correction using Reed-Solomon codes. For a large storage system with 400 information disks, the proposed coding method with 37 check disks increases the MTTDL from 0.10 years to 167 years
Keywords :
RAID; Reed-Solomon codes; combinatorial mathematics; digital storage; disc drives; error correction codes; RAID; Reed-Solomon codes; Steiner triple system; combinatorial theory; disk drive; distributed erasure correction; distributed storage systems; large-scale storage systems; low-density correcting codes; redundant arrays; triple-erasure correcting codes; Aerospace control; Aerospace engineering; Algorithm design and analysis; Centralized control; Control systems; Decoding; Disk drives; Error correction; Large-scale systems; Multimedia databases;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 2006. DFT '06. 21st IEEE International Symposium on
Conference_Location :
Arlington, VA
ISSN :
1550-5774
Print_ISBN :
0-7695-2706-X
Type :
conf
DOI :
10.1109/DFT.2006.42
Filename :
4030928
Link To Document :
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