• DocumentCode
    2906752
  • Title

    Incremental logic rectification

  • Author

    Huang, Shi-Yu ; Chen, Kuang-Chien ; Cheng, Kwang-Ting

  • Author_Institution
    Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA
  • fYear
    1997
  • fDate
    27 Apr-1 May 1997
  • Firstpage
    143
  • Lastpage
    149
  • Abstract
    We address the problem of rectifying an incorrect combinational circuit against a given specification. Based on the symbolic BDD techniques, we consider the rectification process as a sequence of partial corrections. Each partial correction reduces the size of the input vector set producing error responses. Compared with existing approaches, this approach is more general, and able to handle circuits with multiple errors. We also formulate the necessary and sufficient condition of general single-gate correction to achieve better results for some circuits with a single error. To handle larger circuits, we develop a hybrid approach that makes use of the information of structural correspondence between specification and implementation. Experimental results on industrial examples as well as ISCAS85 benchmark circuits are presented to show the effectiveness of our approach
  • Keywords
    Boolean functions; VLSI; automatic testing; combinational circuits; error correction; fault diagnosis; logic CAD; logic testing; ISCAS85 benchmark circuits; VLSI design; circuits with multiple errors; error region pruning; general single-gate correction; hybrid approach; implementation; incorrect combinational circuit; incremental logic rectification; sequence of partial corrections; specification; structural correspondence; symbolic BDD techniques; Binary decision diagrams; Circuits; Debugging; Design optimization; Error correction; Hardware design languages; Logic design; Process design; Time measurement; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium, 1997., 15th IEEE
  • Conference_Location
    Monterey, CA
  • ISSN
    1093-0167
  • Print_ISBN
    0-8186-7810-0
  • Type

    conf

  • DOI
    10.1109/VTEST.1997.599466
  • Filename
    599466