Title :
A Fully Programmable Analog Window Comparator
Author :
Xiao, Rui ; Laknaur, Amit ; Wang, Haibo
Author_Institution :
Dept. of Electr. & Comput. Eng., Southern Illinois Univ. Carbondale, IL
Abstract :
This paper presents a novel design of analog window comparator circuit. The comparator can adaptively adjust its error threshold according to the magnitude of input signal levels. In addition, the circuit can be digitally programmed to realize different error threshold adapting schemes. The design is fabricated using a 0.18mum CMOS technology. Testing results of the fabricated chip are also presented.
Keywords :
CMOS analogue integrated circuits; comparators (circuits); integrated circuit design; programmable circuits; 0.18 micron; CMOS technology; error threshold adapting schemes; fully programmable analog window comparator; CMOS technology; Circuit faults; Circuit testing; Computer errors; Electrical fault detection; Inverters; Logic; Monitoring; Switches; Threshold voltage;
Conference_Titel :
Circuits and Systems, 2007. ISCAS 2007. IEEE International Symposium on
Conference_Location :
New Orleans, LA
Print_ISBN :
1-4244-0920-9
Electronic_ISBN :
1-4244-0921-7
DOI :
10.1109/ISCAS.2007.377884
