Title :
Enhancing observability of signal composition response and error signatures during dynamic SEE analog to digital device testing
Author :
Berg, M. ; Buchner, S. ; Kim, H. ; Friendlich, M. ; Perez, C. ; Phan, A. ; Seidleck, C. ; LaBel, K.
Abstract :
A novel method of dynamic SEE ADC testing is presented. The approach utilizes a FPGA core for processing and has proven to enhance error signature and signal integrity observation verses alternate techniques.
Keywords :
analogue-digital conversion; field programmable gate arrays; integrated circuit testing; FPGA core; dynamic SEE ADC device testing; dynamic SEE analog to digital conversion device testing; error signature enhancement; signal composition response; signal integrity observation; Clocks; Filtration; Noise; Radiation effects; Signal generators; Synchronization; Testing;
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2009 European Conference on
Conference_Location :
Bruges
Print_ISBN :
978-1-4577-0492-5
Electronic_ISBN :
0379-6566
DOI :
10.1109/RADECS.2009.5994666
