Title :
Equivalent IDDQ Tests for Systems with Regulated Power Supply
Author :
Chen, Chuen-Song ; Lo, Jien-Chung ; Xia, Tian
Author_Institution :
Dept. of Electr. & Comput. Eng., Rhode Island Univ., Kingston, RI
Abstract :
This paper presents an equivalent current sensing technique for the applications o tests. This is accomplished by monitoring the operations of existing on-chip voltage regulators, which indirectly provides the IDDQ information. Equivalent IDDQ information is obtained by measuring an internal voltage signal of a regulator. Then, the measured data is shifted out using the IEEE 1149.1 standard. IDDQ based test methods are used to post-process those data for screening defective circuits. Experiments were successfully conducted assuming the TSMC 0.18mum CMOS technology
Keywords :
CMOS integrated circuits; IEEE standards; integrated circuit testing; voltage regulators; 0.18 micron; CMOS technology; IEEE 1149.1 standard; equivalent current sensing technique; internal voltage signal measurement; on-chip voltage regulators; CMOS technology; Circuit testing; Degradation; Electrical resistance measurement; Integrated circuit testing; Power engineering computing; Power supplies; Regulators; System testing; Voltage;
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 2006. DFT '06. 21st IEEE International Symposium on
Conference_Location :
Arlington, VA
Print_ISBN :
0-7695-2706-X
DOI :
10.1109/DFT.2006.28
