• DocumentCode
    2906937
  • Title

    Extensive SEU impact analysis of a PIC microprocessor for selective hardening

  • Author

    Valderas, Mario García ; García, Marta Portela ; López, Celia ; Entrena, Luis

  • Author_Institution
    Electron. Technol. Dept., Univ. Carlos III of Madrid, Leganés, Spain
  • fYear
    2009
  • fDate
    14-18 Sept. 2009
  • Firstpage
    333
  • Lastpage
    336
  • Abstract
    In order to increase the robustness of a circuit against SEUs, fault injection is commonly used to locate weak areas. Autonomous emulation is used to locate weak areas in a PIC18 microprocessor, while it executes three different workloads.
  • Keywords
    fault diagnosis; microcontrollers; peripheral interfaces; radiation hardening (electronics); PIC microprocessor; SEU impact analysis; autonomous emulation; fault injection; selective hardening; Circuit faults; Clocks; Emulation; Flip-flops; Microprocessors; Radiation detectors; Random access memory; FPGA-emulation; Fault Injection; SEU;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation and Its Effects on Components and Systems (RADECS), 2009 European Conference on
  • Conference_Location
    Bruges
  • ISSN
    0379-6566
  • Print_ISBN
    978-1-4577-0492-5
  • Electronic_ISBN
    0379-6566
  • Type

    conf

  • DOI
    10.1109/RADECS.2009.5994670
  • Filename
    5994670
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2906937