Title :
A Metric of Tolerance for the Manufacturing Defects of Threshold Logic Gates
Author :
Dechu, Sandeep ; Goparaju, Manoj Kumar ; Tragoudas, Spyros
Author_Institution :
Dept. of Electr. & Comput. Eng., Southern Illinois Univ., Carbondale, IL
Abstract :
Compared to CMOS logic gates, threshold logic gates are more susceptible to manufacturing inaccuracies. These inaccuracies may inadvertently affect the functionality of the gate. Hence it is very much important to consider the manufacturing defects during the design of gates using threshold logic principle. This paper defines a metric which indicates the degree of tolerance of a designed gate to the manufacturing inaccuracies. Experimental results have been presented for several gates
Keywords :
CMOS logic circuits; logic design; logic gates; threshold logic; CMOS logic gates; manufacturing defects; manufacturing inaccuracies; threshold logic gates; CMOS logic circuits; Computer aided manufacturing; FinFETs; Lithography; Logic circuits; Logic design; Logic devices; Logic gates; Optical bistability; Semiconductor process modeling;
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 2006. DFT '06. 21st IEEE International Symposium on
Conference_Location :
Arlington, VA
Print_ISBN :
0-7695-2706-X
