• DocumentCode
    2907065
  • Title

    Design and Evaluation of a Hardware on-line Program-Flow Checker for Embedded Microcontrollers

  • Author

    Ottavi, M. ; Pontarelli, S. ; Leandri, A. ; Salsano, A.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Northeastern Univ., Boston, MA
  • fYear
    2006
  • fDate
    Oct. 2006
  • Firstpage
    371
  • Lastpage
    379
  • Abstract
    This paper investigates the effects of a class of transient faults, the so-called single event upsets, on the execution of programs in typical microcontroller architecture as can be found on a system on chip for embedded applications. It is observed that the consequences of targeting the registers used in the control flow can cause unexpected jumps of the program and consequent heavy effects on the results or the freeze of the microcontroller. A novel hardware based control flow checker is then introduced and implemented on an FPGA test bed together with the microcontroller core and fault injection circuitry. The FPGA implementation allows to dynamically and quickly injecting faults on the microcontroller whereas the results of the fault injection campaign allow to evaluate the fault coverage of the proposed method with a high degree of flexibility
  • Keywords
    fault simulation; field programmable gate arrays; microcontrollers; microprogramming; radiation hardening (electronics); transients; FPGA; embedded microcontrollers; fault injection; filed programmable gate array; hardware on-line program-flow checker; microcontroller freeze; program jumps; single event upsets; system on chip; transient faults; Circuit faults; Fault tolerant systems; Field programmable gate arrays; Hardware; Microcontrollers; Radiation hardening; Registers; Single event upset; System-on-a-chip; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Defect and Fault Tolerance in VLSI Systems, 2006. DFT '06. 21st IEEE International Symposium on
  • Conference_Location
    Arlington, VA
  • ISSN
    1550-5774
  • Print_ISBN
    0-7695-2706-X
  • Type

    conf

  • DOI
    10.1109/DFT.2006.21
  • Filename
    4030949