Title :
Fault Diagnosis of Analog Circuits Based on Adaptive Test and Output Characteristics
Author :
Miura, Yukiya ; Kato, Jiro
Author_Institution :
Graduate Sch. of Syst. Design, Tokyo Metropolitan Univ.
Abstract :
A method for diagnosing analog circuits that is realized by combining the operation-region model and the X-Y zoning method have been proposed. In the method, the authors cloud implement a diagnosis procedure based on a diagnostic method for digital circuits. In this paper, the method by using an adaptive test to obtain a shorter diagnostic sequence length was improved and its characteristics were shown. Moreover, a new data processing method that utilizes the output response of a circuit to obtain better diagnostic performance was proposed. The effectiveness of the proposed methods by applying them to ITC´97 benchmark circuits was demonstrated with hard faults and soft faults. These improved methods can reduce a diagnostic sequence length without degrading the performance of diagnostic resolution and CPU time
Keywords :
analogue circuits; circuit testing; fault diagnosis; ITC´97; adaptive test; analog circuits; data processing; fault diagnosis; hard faults; output characteristics; shorter diagnostic sequence; soft faults; Analog circuits; Benchmark testing; Central Processing Unit; Circuit faults; Circuit testing; Clouds; Data processing; Degradation; Digital circuits; Fault diagnosis;
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 2006. DFT '06. 21st IEEE International Symposium on
Conference_Location :
Arlington, VA
Print_ISBN :
0-7695-2706-X
DOI :
10.1109/DFT.2006.30
