Title :
Auto-referenced on-die power supply noise measurement circuit
Author :
Chansungsan, Chaiyuth
Author_Institution :
Intel Corp., Hillsboro, OR, USA
Abstract :
An accurate, cost-effective, convenient and high-bandwidth on-die power supply noise measurement circuit is presented. The circuit is auto-referenced, thus saving the cost of an extra power supply for reference and making measurement on a real platform convenient. It is also capable of selectively detecting noises from different bands of frequency spectrum, each due to a different resonance peak in the power delivery network, thus allowing characterization of the noises. The circuit is implemented in a 0.13μm process as part of a PCI-Express link. The noise measurement range is ±105mV with measured 15-mV resolution, and 1ns pulse bandwidth.
Keywords :
electric noise measurement; integrated circuit noise; power supply circuits; 0.13 micron; 1 ns; 15 mV; PCI-Express link; noise characterization; on-die power supply noise measurement circuit; power delivery network; resonance peak; Circuit noise; Circuit simulation; Detectors; Frequency; Noise measurement; Packaging; Pollution measurement; Power supplies; Semiconductor device measurement; Working environment noise;
Conference_Titel :
Custom Integrated Circuits Conference, 2005. Proceedings of the IEEE 2005
Print_ISBN :
0-7803-9023-7
DOI :
10.1109/CICC.2005.1568602
