• DocumentCode
    2907132
  • Title

    Narrow-stripe selective MOVPE technology for high-quality strained InGaAsP MQW structures

  • Author

    Sakata, Yasutaka ; Komatsu, Keiro

  • Author_Institution
    ULSI Device Dev. Lab., NEC Corp., Shiga, Japan
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    41
  • Lastpage
    46
  • Abstract
    Selective MOVPE technology is widely used for realizing advanced photonic integrated devices. Especially, narrow-stripe selective (NS) MOVPE which performs in less than 2 μm-wide open-stripe region can achieve not only in-plane bandgap control but also direct waveguide formation without any semiconductor etching process. Therefore, NS-MOVPE is the powerful method for achieving highly uniform device characteristics. However, the growth mechanism of NS-MOVPE is very complicated due to the surface migration effect on both a dielectric mask and a semiconductor. This paper shows the recent progress in the study of the surface migration effect for understanding the mechanism of NS-MOVPE and introduce the novel pulse-mode NS-MOVPE for achieving an excellent crystal-quality of strained InGaAsP MQW structures
  • Keywords
    III-V semiconductors; MOCVD; gallium arsenide; gallium compounds; indium compounds; masks; semiconductor growth; semiconductor quantum wells; semiconductor superlattices; surface diffusion; vapour phase epitaxial growth; 2 mum; InGaAsP; advanced photonic integrated devices; crystal-quality; dielectric mask; direct waveguide formation; growth mechanism; high-quality strained InGaAsP MQW structures; in-plane bandgap control; narrow-stripe selective MOVPE technology; open-stripe region; pulse-mode NS-MOVPE; strained InGaAsP MQW structures; surface migration; Epitaxial growth; Epitaxial layers; Etching; Indium phosphide; Optical scattering; Optical surface waves; Optical waveguides; Photonic band gap; Quantum well devices; Semiconductor waveguides;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Indium Phosphide and Related Materials, 1999. IPRM. 1999 Eleventh International Conference on
  • Conference_Location
    Davos
  • ISSN
    1092-8669
  • Print_ISBN
    0-7803-5562-8
  • Type

    conf

  • DOI
    10.1109/ICIPRM.1999.773630
  • Filename
    773630