• DocumentCode
    2907224
  • Title

    Design of Low power & Reliable Networks on Chip through joint crosstalk avoidance and forward error correction coding

  • Author

    Pande, Partha Pratim ; Ganguly, Amlan ; Feero, Brett ; Belzer, Benjamin ; Grecu, Cristian

  • Author_Institution
    Sch. of Electr. Eng. & Comput. Sci., Washington State Univ., Pullman, WA
  • fYear
    2006
  • fDate
    Oct. 2006
  • Firstpage
    466
  • Lastpage
    476
  • Abstract
    With the ever-increasing degrees of integration, design of communication architectures for big systems on chip (SoCs) is a challenge. The communication requirements of these large multi processor SoCs (MP-SoCs) are convened by the emerging network-on-a-chip (NoC) paradigm. To become a viable alternative IC design methodology, the NoC paradigm must address system-level reliability issues, which are among the dominant concerns for SoC design. The basic operations of NoCs are governed by on-chip packet switched networks. On the other hand, incorporation of different coding schemes in SoC design is being investigated as a means to increase system reliability. As NoCs are built on packet-switching, it is very natural to modify the data packets by adding extra bits of coded information to protect against any transient malfunction. By incorporating joint crosstalk avoidance coding (CAC) and forward error correction (FEC) schemes in the NoC data stream we are able to enhance the system reliability and at the same time reduce communication energy
  • Keywords
    forward error correction; integrated circuit design; integrated circuit reliability; network-on-chip; packet switching; IC design methodology; MP-SoC; NoC data stream; crosstalk avoidance coding; forward error correction coding; multi processor SoC; networks on chip; on-chip packet switched networks; packet switching; system-level reliability; Codecs; Communication switching; Crosstalk; Energy dissipation; Forward error correction; Linear predictive coding; Network-on-a-chip; Reliability; Switches; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Defect and Fault Tolerance in VLSI Systems, 2006. DFT '06. 21st IEEE International Symposium on
  • Conference_Location
    Arlington, VA
  • ISSN
    1550-5774
  • Print_ISBN
    0-7695-2706-X
  • Type

    conf

  • DOI
    10.1109/DFT.2006.22
  • Filename
    4030959