DocumentCode :
2907241
Title :
Growth of AlN piezoelectric films on diamond for high frequency SAW devices
Author :
Benetti, M. ; Cannatà, D. ; Di Pietrantonio, F. ; Verona, E.
Author_Institution :
Ist. di Acustica O.M. Corbino, CNR, Rome, Italy
Volume :
2
fYear :
2003
fDate :
5-8 Oct. 2003
Firstpage :
1738
Abstract :
Diamond-like-carbon (DLC) films are very attractive for SAW devices applications because of their high SAW velocity, which can allow high frequency operation at moderate line-width resolution. Use of AlN as piezoelectric layer on DLC is also attractive because of its high SAW velocity: the highest among all piezoelectric materials, together with its excellent electrical, mechanical and chemical properties. The problem arising in the growth of AlN films on DLC have prevented, up to now, the use of this materials combination. In this paper we report our recent results on the growth of highly oriented, low stressed AlN films on DLC. SAWs propagation on AIN/DLC has been theoretically investigated together with the electromechanical coupling for both the Rayleigh and Sezawa modes. The theoretical calculations show how high SAW velocities are achievable with good coupling efficiencies. Under proper conditions very large piezoelectric couplings are predicted k2 = 2.2 and 4 for the Rayleigh and Sezawa wave, respectively, comparable to those observed in strongly piezoelectric single crystal such as LiNbO3, but with SAW velocities approximately twice. Experiments performed on AIN/DLC/Si SAW test devices have shown a good agreement between experimental results and theoretical predictions and demonstrate the feasibility of SAW devices based on this technology.
Keywords :
Rayleigh waves; acoustic wave velocity; aluminium compounds; diamond-like carbon; lithium compounds; piezoelectric thin films; surface acoustic wave devices; AlN; LiNbO3; Rayleigh wave; SAW propagation; SAW test devices; SAW velocity; Sezawa wave; diamond-like-carbon films; electromechanical coupling; high frequency SAW devices; high frequency operation; materials combination; moderate line-width resolution; piezoelectric couplings; piezoelectric films; piezoelectric layer; piezoelectric materials; piezoelectric single crystal; theoretical predictions; Acoustic devices; Acoustic testing; Acoustic waves; Chemicals; Frequency; Performance evaluation; Piezoelectric films; Surface acoustic wave devices; Surface acoustic waves; Zinc oxide;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Ultrasonics, 2003 IEEE Symposium on
Print_ISBN :
0-7803-7922-5
Type :
conf
DOI :
10.1109/ULTSYM.2003.1293247
Filename :
1293247
Link To Document :
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