Title :
Data Dependent Jitter Characterization Based on Fourier Analysis
Author :
Mu, Di ; Xia, Tian ; Zheng, Hao
Author_Institution :
Dept. of Electr. & Comput. Eng., Vermont Univ., Burlington, VT
Abstract :
In this paper, the authors focus on modeling the data dependent jitter (DDJ) in high-speed interconnect. To investigate the data dependent jitter, the analysis is performed with Fourier series based on the interconnect RLC model. By calculating the pattern dependent delay deviation, the data dependent jitter is characterized. To validate the modeling accuracy, the analysis results have been compared against the Cadence simulations
Keywords :
Fourier analysis; Fourier series; delays; electronic design automation; integrated circuit interconnections; Cadence simulations; Fourier analysis; Fourier series; data dependent jitter characterization; delay deviation calculation; high-speed interconnect; interconnect RLC model; Bandwidth; Bit error rate; Data engineering; Delay; Distributed parameter circuits; Fourier series; Integrated circuit interconnections; Thermal conductivity; Timing jitter; Very large scale integration;
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 2006. DFT '06. 21st IEEE International Symposium on
Conference_Location :
Arlington, VA
Print_ISBN :
0-7695-2706-X
DOI :
10.1109/DFT.2006.19
