Title :
Evaluating the impact of DFM library optimizations on alpha-induced SEU sensitivity in a microprocessor core
Author :
Rech, Paolo ; Paccagnella, Alessandro ; Grosso, Michelangelo ; Reorda, Matteo Sonza ; Melchiori, Fabio ; Appello, Davide
Author_Institution :
Dipt. di Ing. Elettron. e Inf., Univ. di Padova, Padova, Italy
Abstract :
This paper presents and discusses the results of Alpha Single Event Upset (SEU) tests on an embedded 8051 microprocessor core implemented in three different cell libraries. Each standard cell library is based on a different Design For Manufacturability (DFM) optimization strategy; our goal is to understand how these strategies may affect the device sensitivity to alpha-induced Soft Errors. The three implementations are tested exploiting advanced Design for Testability (DfT) methodologies and radiation experiments results are compared.
Keywords :
design for manufacture; design for testability; microprocessor chips; system-on-chip; alpha-induced single event upset sensitivity; alpha-induced soft errors; design for manufacturability library optimization; design for testability methodology; device sensitivity; embedded 8051 microprocessor core; radiation experiments; system-on-chip; Circuit faults; Computer architecture; Layout; Libraries; Microprocessors; Sensitivity; System-on-a-chip; Alpha Particles; DFM; Microprocessor; Radiation Effect; Standard Cells;
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2009 European Conference on
Conference_Location :
Bruges
Print_ISBN :
978-1-4577-0492-5
Electronic_ISBN :
0379-6566
DOI :
10.1109/RADECS.2009.5994699
