Evaluating the impact of DFM library optimizations on alpha-induced SEU sensitivity in a microprocessor core

Author

Rech, Paolo ; Paccagnella, Alessandro ; Grosso, Michelangelo ; Reorda, Matteo Sonza ; Melchiori, Fabio ; Appello, Davide

Author_Institution

Dipt. di Ing. Elettron. e Inf., Univ. di Padova, Padova, Italy

fYear

2009

fDate

14-18 Sept. 2009

Firstpage

481

Lastpage

488

Abstract

This paper presents and discusses the results of Alpha Single Event Upset (SEU) tests on an embedded 8051 microprocessor core implemented in three different cell libraries. Each standard cell library is based on a different Design For Manufacturability (DFM) optimization strategy; our goal is to understand how these strategies may affect the device sensitivity to alpha-induced Soft Errors. The three implementations are tested exploiting advanced Design for Testability (DfT) methodologies and radiation experiments results are compared.

Keywords

design for manufacture; design for testability; microprocessor chips; system-on-chip; alpha-induced single event upset sensitivity; alpha-induced soft errors; design for manufacturability library optimization; design for testability methodology; device sensitivity; embedded 8051 microprocessor core; radiation experiments; system-on-chip; Circuit faults; Computer architecture; Layout; Libraries; Microprocessors; Sensitivity; System-on-a-chip; Alpha Particles; DFM; Microprocessor; Radiation Effect; Standard Cells;

fLanguage

English

Publisher

ieee

Conference_Titel

Radiation and Its Effects on Components and Systems (RADECS), 2009 European Conference on

Conference_Location

Bruges

ISSN

0379-6566

Print_ISBN

978-1-4577-0492-5

Electronic_ISBN

0379-6566

Type

conf

DOI

10.1109/RADECS.2009.5994699

Filename

5994699