Abstract :
The following topics are dealt with: integrated circuits; NEMS; single event effects; hardness assurance; terrestrial environments; radiation environments; photonics; dosimetry and hardening design.
Keywords :
dosimetry; integrated circuits; nanoelectromechanical devices; radiation hardening (electronics); NEMS; dosimetry; hardening design; hardness assurance; integrated circuit; photonic; radiation environment; single event effect;
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2009 European Conference on
Conference_Location :
Bruges
Print_ISBN :
978-1-4577-0492-5
DOI :
10.1109/RADECS.2009.5994721
