• DocumentCode
    2907929
  • Title

    Characterization of new radiation hardened bipolar operational amplifiers

  • Author

    Chaumont, Géraldine ; Cornanguer, Benoît ; Briand, Patrick ; Prugne, Christophe ; Malou, Florence

  • Author_Institution
    STMicroelectronics, Rennes, France
  • fYear
    2009
  • fDate
    14-18 Sept. 2009
  • Firstpage
    593
  • Lastpage
    597
  • Abstract
    New operational amplifiers have been ELDRS and heavy ions characterized. This paper presents the TID results at high and low dose rate and SEE tests results.
  • Keywords
    operational amplifiers; radiation hardening (electronics); SEE tests; TID; heavy ions; low dose rate; radiation hardened bipolar operational amplifiers; single event effect; Bandwidth; Facsimile; Feedback amplifier; Ions; Radiation effects; Radiation hardening; Single Event Effect (SEE); dose-rate; operational amplifier;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation and Its Effects on Components and Systems (RADECS), 2009 European Conference on
  • Conference_Location
    Bruges
  • ISSN
    0379-6566
  • Print_ISBN
    978-1-4577-0492-5
  • Electronic_ISBN
    0379-6566
  • Type

    conf

  • DOI
    10.1109/RADECS.2009.5994727
  • Filename
    5994727