DocumentCode
2907929
Title
Characterization of new radiation hardened bipolar operational amplifiers
Author
Chaumont, Géraldine ; Cornanguer, Benoît ; Briand, Patrick ; Prugne, Christophe ; Malou, Florence
Author_Institution
STMicroelectronics, Rennes, France
fYear
2009
fDate
14-18 Sept. 2009
Firstpage
593
Lastpage
597
Abstract
New operational amplifiers have been ELDRS and heavy ions characterized. This paper presents the TID results at high and low dose rate and SEE tests results.
Keywords
operational amplifiers; radiation hardening (electronics); SEE tests; TID; heavy ions; low dose rate; radiation hardened bipolar operational amplifiers; single event effect; Bandwidth; Facsimile; Feedback amplifier; Ions; Radiation effects; Radiation hardening; Single Event Effect (SEE); dose-rate; operational amplifier;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation and Its Effects on Components and Systems (RADECS), 2009 European Conference on
Conference_Location
Bruges
ISSN
0379-6566
Print_ISBN
978-1-4577-0492-5
Electronic_ISBN
0379-6566
Type
conf
DOI
10.1109/RADECS.2009.5994727
Filename
5994727
Link To Document