DocumentCode :
2907930
Title :
VGF crystal growth and vapor-phase Fe doping technologies for semi-insulating 100 mm diameter InP substrates
Author :
Asahi, T. ; Uchida, M. ; Kainosho, K. ; Oda, O.
Author_Institution :
Central R&D Lab., Japan Energy Corp., Toda, Japan
fYear :
1999
fDate :
1999
Firstpage :
249
Lastpage :
254
Abstract :
100 mm diameter ⟨100⟩ semi-insulating InP substrates were obtained after conductive undoped wafers were annealed under volatile FeP2 atmosphere. Undoped crystals were grown by the VGF method using a high pressure furnace. In this growth method, we investigated the reduction of the temperature fluctuation by computer simulation for preventing twinning. The temperature fluctuation near the seed crystal could be reduced from ±0.3°C to ±0.03°C after improvement of the hot-zone, based on the simulation results. Semi-insulating InP is conventionally produced by Fe doping during crystal growth. In the conventional doping method, the Fe concentration is varied along the growth axis due to Fe segregation in InP. In order to obtain good homogeneity of Fe concentrations from wafer to wafer, we have developed a new Fe doping technology in which wafers are annealed under volatile FeP2 atmosphere. In this work, we applied this Fe doping technology to 100 mm diameter ⟨100⟩ InP substrates and could obtain large diameter semi-insulating substrates
Keywords :
III-V semiconductors; crystal growth from melt; indium compounds; iron; segregation; semiconductor doping; semiconductor growth; substrates; 100 mm; Fe concentration; InP:Fe; computer simulation; crystal growth; high pressure furnace; segregation; semi-insulating substrates; temperature fluctuation; vapor-phase Fe doping; vertical gradient freezing; volatile FeP2 atmosphere; Annealing; Atmosphere; Computer simulation; Crystals; Doping; Fluctuations; Furnaces; Indium phosphide; Iron; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Indium Phosphide and Related Materials, 1999. IPRM. 1999 Eleventh International Conference on
Conference_Location :
Davos
ISSN :
1092-8669
Print_ISBN :
0-7803-5562-8
Type :
conf
DOI :
10.1109/ICIPRM.1999.773682
Filename :
773682
Link To Document :
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