DocumentCode
2907930
Title
VGF crystal growth and vapor-phase Fe doping technologies for semi-insulating 100 mm diameter InP substrates
Author
Asahi, T. ; Uchida, M. ; Kainosho, K. ; Oda, O.
Author_Institution
Central R&D Lab., Japan Energy Corp., Toda, Japan
fYear
1999
fDate
1999
Firstpage
249
Lastpage
254
Abstract
100 mm diameter ⟨100⟩ semi-insulating InP substrates were obtained after conductive undoped wafers were annealed under volatile FeP2 atmosphere. Undoped crystals were grown by the VGF method using a high pressure furnace. In this growth method, we investigated the reduction of the temperature fluctuation by computer simulation for preventing twinning. The temperature fluctuation near the seed crystal could be reduced from ±0.3°C to ±0.03°C after improvement of the hot-zone, based on the simulation results. Semi-insulating InP is conventionally produced by Fe doping during crystal growth. In the conventional doping method, the Fe concentration is varied along the growth axis due to Fe segregation in InP. In order to obtain good homogeneity of Fe concentrations from wafer to wafer, we have developed a new Fe doping technology in which wafers are annealed under volatile FeP2 atmosphere. In this work, we applied this Fe doping technology to 100 mm diameter ⟨100⟩ InP substrates and could obtain large diameter semi-insulating substrates
Keywords
III-V semiconductors; crystal growth from melt; indium compounds; iron; segregation; semiconductor doping; semiconductor growth; substrates; 100 mm; Fe concentration; InP:Fe; computer simulation; crystal growth; high pressure furnace; segregation; semi-insulating substrates; temperature fluctuation; vapor-phase Fe doping; vertical gradient freezing; volatile FeP2 atmosphere; Annealing; Atmosphere; Computer simulation; Crystals; Doping; Fluctuations; Furnaces; Indium phosphide; Iron; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Indium Phosphide and Related Materials, 1999. IPRM. 1999 Eleventh International Conference on
Conference_Location
Davos
ISSN
1092-8669
Print_ISBN
0-7803-5562-8
Type
conf
DOI
10.1109/ICIPRM.1999.773682
Filename
773682
Link To Document