Low dose rate testing on commercial micropower single supply rail-to-rail instrumentation amplifiers

Author

Álvarez, María T. ; Domínguez, José A. ; Hernando, Carlos ; Fernández, César P. ; Arruego, Ignacio

Author_Institution

Lab. de Optoelectronica, Inst. Nac. de Tec. Aeroespacial (INTA), Madrid, Spain

fYear

2009

fDate

14-18 Sept. 2009

Firstpage

598

Lastpage

601

Abstract

Instrumentation amplifiers suitable for low Earth orbit space missions were irradiated at low dose rate with gamma particles by INTA. The aim of this work is to analyze the enhanced of low dose rate sensitivity in devices based on bipolar technology, which are sensitive to it. For this purpose parameters as gain error, frequency response, offset voltage, supply, offset and bias currents were measured. Results and conclusions about the components radiation hardness assurance are reported.

Keywords

frequency response; instrumentation amplifiers; power amplifiers; radiation hardening (electronics); space vehicle electronics; bias currents; bipolar technology; component radiation hardness assurance; frequency response; gain error; gamma particles; low Earth orbit space missions; low dose rate sensitivity; low dose rate testing; micropower single supply rail-to-rail instrumentation amplifiers; offset voltage; Annealing; Current measurement; Gain; Instruments; Performance evaluation; Radiation effects; Voltage measurement; Radiation effects; enhanced of low rate sensitivity; instrumentation amplifiers; total ionizing dose;

fLanguage

English

Publisher

ieee

Conference_Titel

Radiation and Its Effects on Components and Systems (RADECS), 2009 European Conference on

Conference_Location

Bruges

ISSN

0379-6566

Print_ISBN

978-1-4577-0492-5

Electronic_ISBN

0379-6566

Type

conf

DOI

10.1109/RADECS.2009.5994728

Filename

5994728