Title :
ATMEL ATF280E rad hard SRAM based reprogrammable FPGA SEE test results
Author :
Mantelet, Guy ; Briet, Michel ; Rouxel, Guy ; Hachad, Said ; Bancelin, Bernard ; de saint Roman, Dominique
Author_Institution :
ATMEL Nantes, Nantes, France
Abstract :
The paper presents the new ATMEL rad-hard SRAM based reprogrammable FPGA design choices as well as the SEE (Single Event Effect) test results to illustrate the capability of this product to be used in space.
Keywords :
SRAM chips; field programmable gate arrays; integrated circuit testing; logic design; ATMEL ATF280E rad hard SRAM; FPGA design; SEE test; reprogrammable FPGA SEE test; single event effect test; Computer architecture; Field programmable gate arrays; Microprocessors; Radiation hardening; Random access memory; Single event upset; Transient analysis; LET; Single Event Latchup (SEL); Single Event Transient (SET); Single Event Upset (SEU);
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2009 European Conference on
Conference_Location :
Bruges
Print_ISBN :
978-1-4577-0492-5
Electronic_ISBN :
0379-6566
DOI :
10.1109/RADECS.2009.5994730
