Title :
SEU data and fault tolerance analysis of a LEON 3FT processor
Author :
Jordan, A. ; Hafer, C. ; Mabra, J. ; Griffith, S. ; Nagy, J. ; Lahey, M. ; Harris, D.
Author_Institution :
Aeroflex Colorado Springs, Colorado Springs, CO, USA
Abstract :
Single-bit per word error protection is implemented on this LEON 3 fault tolerant processor. SEU data is reviewed and fault analysis is examined based on processor operation and operational environment.
Keywords :
fault tolerance; integrated circuit reliability; microprocessor chips; LEON 3FT processor; SEU data; fault analysis; fault tolerance analysis; single-bit per word error protection; Fault tolerance; Fault tolerant systems; Random access memory; Registers; Single event upset; Software; Springs; Fault tolerance; LEON; SEU; Single event upset;
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2009 European Conference on
Conference_Location :
Bruges
Print_ISBN :
978-1-4577-0492-5
Electronic_ISBN :
0379-6566
DOI :
10.1109/RADECS.2009.5994733
