Title :
Measurement and analysis of delay variation due to inductive coupling
Author :
Ogasahara, Yasuhiro ; Hashimoto, Masanori ; Onoye, Takao
Author_Institution :
Dept. of Inf. Syst. Eng., Osaka Univ., Suita
Abstract :
Inductive coupling is becoming a design concern for global interconnects in advanced technologies. This paper discusses interconnect delay variation due to inductive coupling. We first examine the difference in delay change curve with respect to relative transition timings of aggressors and victim between with and without considering inductive coupling by simulation. We verify that the difference in delay change curve due to inductive coupling is also observed in measurement of test chips
Keywords :
CMOS integrated circuits; delays; integrated circuit interconnections; integrated circuit testing; timing; inductive coupling; interconnect delay variation; relative transition timing; Circuit simulation; Coupling circuits; Crosstalk; Current measurement; Delay estimation; Frequency measurement; Integrated circuit interconnections; Modeling; Noise measurement; Semiconductor device measurement;
Conference_Titel :
Custom Integrated Circuits Conference, 2005. Proceedings of the IEEE 2005
Conference_Location :
San Jose, CA
Print_ISBN :
0-7803-9023-7
DOI :
10.1109/CICC.2005.1568666
