2908552

3-Weight Pseudo-Random Test Generation Based on a Deterministic Test Set

Pomeranz, Irith ; Reddy, Sudhakar M.

University of Iowa

1992

4-7 Jan 1992

148

153

Automatic test pattern generation; Benchmark testing; Circuit faults; Circuit testing; Cities and towns; Electrical fault detection; Fault detection; Hardware; Legged locomotion; Test pattern generators;

English

ieee

VLSI Design, 1992. Proceedings., The Fifth International Conference on

1063-9667

0-8186-2465-5

conf

10.1109/ICVD.1992.658037

658037