DocumentCode
2908633
Title
TSV reduction in homogeneous 3D FPGAs by logic resource and input pad replication
Author
Moallempour, Seyyed Hasan ; Razavi, Seyyed Ahmad ; Zamani, Morteza Saheb
Author_Institution
Dept. of Comput. Eng. & IT, Amirkabir Univ. of Technol., Tehran, Iran
fYear
2012
fDate
Jan. 31 2012-Feb. 2 2012
Firstpage
1
Lastpage
5
Abstract
One of the major challenges in the process of three-dimensional integrated circuit fabrication is the manufacturing of through silicon vias (TSV). These TSVs compared with other connection elements require high manufacturing costs as well as large silicon area. In this paper, replication technique has been used to reduce the number of TSVs in 3D FPGAs. Replication is implemented for circuit input pads and logic blocks. Experimental results over 20 MCNC benchmarks show 33% and 20% reduction in the number of TSVs and delay on average, respectively, at the cost of 3% more logic blocks and 3% more input pads that they place in the unused resources of FPGA.
Keywords
field programmable gate arrays; integrated logic circuits; three-dimensional integrated circuits; 3D FPGA; MCNC benchmarks; TSV reduction; delay; input pad replication; logic blocks; logic resource; three-dimensional integrated circuit fabrication process; through silicon vias manufacturing; Benchmark testing; Delay; Field programmable gate arrays; Pins; Routing; Switches; Wires; Replication; Three dimensional FPGA; Through silicon via;
fLanguage
English
Publisher
ieee
Conference_Titel
3D Systems Integration Conference (3DIC), 2011 IEEE International
Conference_Location
Osaka
Print_ISBN
978-1-4673-2189-1
Type
conf
DOI
10.1109/3DIC.2012.6263033
Filename
6263033
Link To Document