• DocumentCode
    2908633
  • Title

    TSV reduction in homogeneous 3D FPGAs by logic resource and input pad replication

  • Author

    Moallempour, Seyyed Hasan ; Razavi, Seyyed Ahmad ; Zamani, Morteza Saheb

  • Author_Institution
    Dept. of Comput. Eng. & IT, Amirkabir Univ. of Technol., Tehran, Iran
  • fYear
    2012
  • fDate
    Jan. 31 2012-Feb. 2 2012
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    One of the major challenges in the process of three-dimensional integrated circuit fabrication is the manufacturing of through silicon vias (TSV). These TSVs compared with other connection elements require high manufacturing costs as well as large silicon area. In this paper, replication technique has been used to reduce the number of TSVs in 3D FPGAs. Replication is implemented for circuit input pads and logic blocks. Experimental results over 20 MCNC benchmarks show 33% and 20% reduction in the number of TSVs and delay on average, respectively, at the cost of 3% more logic blocks and 3% more input pads that they place in the unused resources of FPGA.
  • Keywords
    field programmable gate arrays; integrated logic circuits; three-dimensional integrated circuits; 3D FPGA; MCNC benchmarks; TSV reduction; delay; input pad replication; logic blocks; logic resource; three-dimensional integrated circuit fabrication process; through silicon vias manufacturing; Benchmark testing; Delay; Field programmable gate arrays; Pins; Routing; Switches; Wires; Replication; Three dimensional FPGA; Through silicon via;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    3D Systems Integration Conference (3DIC), 2011 IEEE International
  • Conference_Location
    Osaka
  • Print_ISBN
    978-1-4673-2189-1
  • Type

    conf

  • DOI
    10.1109/3DIC.2012.6263033
  • Filename
    6263033