Title :
An Efficient Rule Based Fault Simulator
Author :
Tharakan, Oommen ; Jacob, James ; Srinivas, M.K.
Author_Institution :
VSSC, Trivandrum
Keywords :
Automatic testing; Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Electrical fault detection; Integrated circuit interconnections; Logic; System testing; Very large scale integration;
Conference_Titel :
VLSI Design, 1992. Proceedings., The Fifth International Conference on
Print_ISBN :
0-8186-2465-5
DOI :
10.1109/ICVD.1992.658038