DocumentCode
2908842
Title
Fault-tolerant round robin A/D converter system
Author
Beckmann, Paul E. ; Musicus, Bruce R.
Author_Institution
MIT Electron. Res. Lab., Cambridge, MA, USA
fYear
1990
fDate
3-6 Apr 1990
Firstpage
1759
Abstract
A robust A/D converter system is described which requires much less hardware overhead than traditional modular redundancy approaches. A modest amount of oversampling is used to generate information which can be exploited to achieve fault tolerance. A generalized likelihood ratio test is used to detect the most likely failure and also to estimate the optimum signal reconstruction. The error detection and correction algorithm reduces to a simple form and requires only a slight amount of hardware overhead. A derivation of the algorithm is followed by simulation results
Keywords
analogue-digital conversion; error correction; error detection; error correction; error detection; fault tolerance; generalized likelihood ratio test; hardware overhead; optimum signal reconstruction; oversampling; round robin A/D converter system; Circuit faults; Error correction; Fault detection; Fault tolerance; Fault tolerant systems; Hardware; Laboratories; Redundancy; Robustness; Round robin; Sampling methods; Signal reconstruction; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Acoustics, Speech, and Signal Processing, 1990. ICASSP-90., 1990 International Conference on
Conference_Location
Albuquerque, NM
ISSN
1520-6149
Type
conf
DOI
10.1109/ICASSP.1990.115823
Filename
115823
Link To Document