• DocumentCode
    2908868
  • Title

    A Numerical Assessment of the Semiconvergence Behavior in an Inverse-Scattering Approach to Electromagnetic Imaging

  • Author

    Bozza, G. ; Estatico, C. ; Pastorino, M. ; Randazzo, A.

  • Author_Institution
    Univ. of Genoa, Genova
  • fYear
    2007
  • fDate
    1-3 May 2007
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    In this paper an approach to invert measured data in electromagnetic imaging based on inverse scattering is numerically evaluated. In particular, an inexact Newton approach is adopted and the semiconvergence behavior of the proposed iterative method, due to the ill-posedness of the considered inverse problem, is assessed: Indeed the iteratates of the algorithm first converge towards the exact solution up to a certain iteration number and, after that, the noise starts to dominate the restoration, and the subsequent iterations deviate from the exact one. Basic theoretical results concerning this semi-convergence phenomenon are briefly recalled, whereas a numerical assessment is performed concerning the application of the method to the image reconstruction of dielectric targets by using interrogating waves in a multiview arrangement.
  • Keywords
    Newton method; convergence of numerical methods; electromagnetic wave scattering; image reconstruction; imaging; inverse problems; iterative methods; dielectric targets; electromagnetic imaging; electromagnetic scattering; image reconstruction; inexact Newton approach; inverse problem; inverse scattering; iterative methods; multiview arrangement; semiconvergence phenomenon; Computer science; Data engineering; Electromagnetic scattering; Frequency; Instrumentation and measurement; Inverse problems; Iterative algorithms; Mathematics; Microwave imaging; Microwave theory and techniques; Ill-Posed Problems; Imaging Systems; Inexact Newton Methods; Inverse Scattering; Inverse problems; Regularization Techniques;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference Proceedings, 2007. IMTC 2007. IEEE
  • Conference_Location
    Warsaw
  • ISSN
    1091-5281
  • Print_ISBN
    1-4244-0588-2
  • Type

    conf

  • DOI
    10.1109/IMTC.2007.379277
  • Filename
    4258103