• DocumentCode
    2909066
  • Title

    The hidden crisis in test effectiveness

  • Author

    Scully, John K.

  • Author_Institution
    JKS Syst. Ltd., Westlake Village, CA, USA
  • fYear
    1998
  • fDate
    24-27 Aug 1998
  • Firstpage
    59
  • Lastpage
    66
  • Abstract
    The sophistication and complexity of avionic, and other, prime systems has been growing at a pace that has not been matched by commensurate improvements in test technology. The result is NFF (no fault found) and other test effectiveness deficiencies that will soon, if they have not already, reach crisis levels. This pending crisis is all the more serious because it tends to be hidden by a variety of technical, administrative and commercial factors that often mask the real problems, and that sometimes even hinder the measures needed to correct them. Corrective action requires recognition of the true nature of test effectiveness deficiencies, the paradigms and processes with which they are associated, and the changes required to keep pace with modern prime system technology, maintenance requirements and safety objectives
  • Keywords
    automatic test equipment; avionics; built-in self test; economics; electronic equipment testing; production testing; administrative factors; avionic; commercial factors; maintenance; no fault found; safety objectives; technical factors; test effectiveness; test technology; Aerospace electronics; Circuit faults; Circuit testing; Costs; Event detection; Fault detection; Software safety; Software testing; System testing; Terminology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON '98. IEEE Systems Readiness Technology Conference., 1998 IEEE
  • Conference_Location
    Salt Lake City, UT
  • ISSN
    1088-7725
  • Print_ISBN
    0-7803-4420-0
  • Type

    conf

  • DOI
    10.1109/AUTEST.1998.713421
  • Filename
    713421