• DocumentCode
    2909113
  • Title

    Integrated Family of Test Equipment (IFTE) Electro-Optic Test Facility (EOTF)

  • Author

    Weinland, Ron ; Romania, Jay

  • Author_Institution
    Dept. of Army, U.S. AAMCOM, Redstone Arsenal, AL, USA
  • fYear
    1998
  • fDate
    24-27 Aug 1998
  • Firstpage
    72
  • Lastpage
    77
  • Abstract
    Major weapon systems use multiple forms of electrooptics (EO), be it forward looking infrared (FLIR), direct view optics (DVO), trackers, laser range finders (LRF), or TV systems. Furthermore, EO technology is finding its way into less conventional military uses such as chemical detection/early warning systems, landmine detection, and aboard helicopters searching for the wounded. Clearly, EO technology has changed the face of the battlefield. We can only expect the proliferation of military EO systems to continue. The authors describe the need for an Electro-Optics Test Facility (EOTF) which features a general purpose EO tester capable of being transported by conventional rail, air, marine, and ground modes. It must be able to survive nuclear, biological and chemical attacks and be operated by soldiers dressed to survive in such a hazardous environment. Furthermore, to become the Army´s standard EO tester, the EOTF must be able to test the up and coming EO technologies such as second and thir generation FLIRs and eye safe lasers. The system architecture is described and the use of VXI instruments is discussed. Apache TADS/PNVS TPS status is outlined
  • Keywords
    automatic test equipment; computer architecture; electro-optical devices; laser ranging; military equipment; peripheral interfaces; TV systems; direct view optics; electro-optic test facility; laser range finders; military EO systems; trackers; weapon systems; Biomedical optical imaging; Chemical lasers; Chemical technology; Landmine detection; Lasers and electrooptics; Marine technology; Military aircraft; Test equipment; Testing; Weapons;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON '98. IEEE Systems Readiness Technology Conference., 1998 IEEE
  • Conference_Location
    Salt Lake City, UT
  • ISSN
    1088-7725
  • Print_ISBN
    0-7803-4420-0
  • Type

    conf

  • DOI
    10.1109/AUTEST.1998.713423
  • Filename
    713423