• DocumentCode
    2909326
  • Title

    Tuning of electron occupancy in luminescence of single InP/GaInP quantum dot

  • Author

    Samuelson, Lars ; Hessman, Dan ; Persson, Jonas ; Pistol, Mats-Erik ; Pryor, Craig ; Seifert, Werner

  • Author_Institution
    Dept. of Solid State Phys., Lund Univ., Sweden
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    18
  • Abstract
    Summary form only given. Macro- as well as micro-photoluminescence studies of InP/GaInP quantum dots (QDs) fabricated via the Stranski-Krastanow growth mode always show multiple luminescence lines, with an unexpected spectral width even for an individual QD. The origin of this unusual behavior has been debated and until now no clear picture has emerged. We have recently developed a new spectroscopic tool in which we can follow the luminescence of a single QD during the application of an electric field via a transparent Schottky barrier on the surface of the GaInP barrier material. This enables us to follow the evolution of each of the peaks as function of applied bias, with respect to (i) spectral shifts, (ii) intensities and (iii) line-widths. We will present experimental data and computer simulation results which show that during optical illumination with intensities such that luminescence is detected, a condition very close to flat-band is obtained and an open-circuit voltage corresponding to the Schottky-barrier height is detected
  • Keywords
    III-V semiconductors; Schottky barriers; gallium compounds; indium compounds; photoluminescence; semiconductor quantum dots; InP-GaInP; InP/GaInP single quantum dot; Schottky barrier height; Stranski-Krastanow growth; electric field; electron occupancy tuning; photoluminescence; Computer simulation; Electrons; Indium phosphide; Lighting; Luminescence; Optical materials; Quantum dots; Schottky barriers; Spectroscopy; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Indium Phosphide and Related Materials, 1999. IPRM. 1999 Eleventh International Conference on
  • Conference_Location
    Davos
  • ISSN
    1092-8669
  • Print_ISBN
    0-7803-5562-8
  • Type

    conf

  • DOI
    10.1109/ICIPRM.1999.773770
  • Filename
    773770