• DocumentCode
    2909519
  • Title

    SCIPS: An emulation methodology for fault injection in processor caches

  • Author

    Wulf, Nicholas ; Cieslewski, Grzegorz ; Gordon-Ross, Ann ; George, Alan D.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Florida, Gainesville, FL, USA
  • fYear
    2011
  • fDate
    5-12 March 2011
  • Firstpage
    1
  • Lastpage
    9
  • Abstract
    Due to the high level of radiation endured by space systems, fault-tolerant verification is a critical design step for these systems. Space-system designers use fault-injection tools to introduce system faults and observe the system´s response to these faults. Since a processor´s cache accounts for a large percentage of total chip area and is thus more likely to be affected by radiation, the cache represents a key system component for fault-tolerant verification. Unfortunately, processor architectures limit cache accessibility, making direct fault injection into cache blocks impossible. Therefore, cache faults can be emulated by injecting faults into data accessed by load instructions. In this paper, we introduce SPFI-TILE, a software-based fault-injection tool for many-core devices. SPFI-TILE emulates cache fault injections by randomly injecting faults into load instructions. In order to provide unbiased fault injections, we present the cache fault-injection methodology SCIPS (Smooth Cache Injection Per Skipping). Results from MATLAB simulation and integration with SPFI-TILE reveal that SCIPS successfully distributes fault-injection probabilities across load instructions, providing an unbiased evaluation and thus more accurate verification of fault tolerance in cache memories.
  • Keywords
    cache storage; fault tolerant computing; multiprocessing systems; SCIPS; SPFI-TILE; cache memory; emulation methodology; fault-tolerant verification; load instruction; many-core device; matlab simulation; processor architecture; processor cache; smooth cache injection per skipping; software-based fault injection tool; space system; Circuit faults; Fault tolerance; Fault tolerant systems; Hardware; Registers; Tiles; Transient analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Aerospace Conference, 2011 IEEE
  • Conference_Location
    Big Sky, MT
  • ISSN
    1095-323X
  • Print_ISBN
    978-1-4244-7350-2
  • Type

    conf

  • DOI
    10.1109/AERO.2011.5747450
  • Filename
    5747450