Using pass/fail limits as a diagnostic tool

Author

Dill, Harry

Author_Institution

Deep Creek Technol. Inc., USA

fYear

1998

fDate

24-27 Aug 1998

Firstpage

301

Lastpage

308

Abstract

This paper addresses the improvement of diagnostic resolution by judicious selection of pass/fail limits. Emphasis is placed on the use of pass/fail limits to discriminate among suspected failures in a known faulty circuit and increase test outcome confidence. Analog circuit simulations serve to illustrate the relationship between failed circuit behavior, pass/fail limits and the associated diagnostic inferences. Interim findings included here were presented at the IEEE International Workshop on System Test and Diagnosis. These findings have been updated to include results from application to a large scale project

Keywords

analogue circuits; automatic test equipment; circuit simulation; circuit testing; failure analysis; fault diagnosis; probability; IEEE; UUT; analog circuit simulation; binary tests; diagnostic inferences; diagnostic resolution; fault isolation; large scale project; pass/fail limits; tertiary tests; Analog circuits; Assembly; Circuit faults; Circuit testing; Electrical fault detection; Electronic equipment testing; Fault detection; Logic testing; Propulsion; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

AUTOTESTCON '98. IEEE Systems Readiness Technology Conference., 1998 IEEE

Conference_Location

Salt Lake City, UT

ISSN

1088-7725

Print_ISBN

0-7803-4420-0

Type

conf

DOI

10.1109/AUTEST.1998.713460

Filename

713460