DocumentCode :
2910111
Title :
Evaluation techniques for biometrics-based authentication systems (FRR)
Author :
Bolle, Ruud M. ; Pankanti, Sharath ; Ratha, Nalini K.
Author_Institution :
IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
Volume :
2
fYear :
2000
fDate :
2000
Firstpage :
831
Abstract :
Biometrics-based authentication is becoming popular because of increasing ease-of-use and reliability. Performance evaluation of such systems is an important issue. We attempt to address two aspects of performance evaluation that have been conventionally neglected. First, the “difficulty” of the data that is used in a study influences the evaluation results. We propose some measures to characterize the data set so that the performance of a given system on different data sets can be compared. Second, conventional studies often have reported the false reject and false accept rates (FRR, FAR) in the form of match score distributions. However, no confidence intervals are computed for these distributions, hence no indication of the significance of the estimates is given. In this paper, we systematically study and compare parametric and nonparametric (bootstrap) methods for measuring confidence intervals. We give special attention to false reject rate estimates
Keywords :
biometrics (access control); pattern recognition; software performance evaluation; software reliability; FRR; biometrics-based authentication systems; bootstrap methods; confidence interval measurement; false accept rates; false reject rates; match score distributions; nonparametric methods; parametric methods; Authentication; Biometrics; Distributed computing; Error analysis; Fingerprint recognition; Fingers; Sensor phenomena and characterization; State estimation; Statistics; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Pattern Recognition, 2000. Proceedings. 15th International Conference on
Conference_Location :
Barcelona
ISSN :
1051-4651
Print_ISBN :
0-7695-0750-6
Type :
conf
DOI :
10.1109/ICPR.2000.906204
Filename :
906204
Link To Document :
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