Title :
Concurrent checking and unidirectional errors in multiple-valued circuits
Author :
Wessels, David ; Muzio, Jon C.
Author_Institution :
VLSI Design & Test Group, Victoria Univ., BC, Canada
Abstract :
The concept of unateness for multiple-valued logic circuits and its usefulness for concurrent checking through the use of unidirectional error-detecting codes are examined. Three such codes are adapted for multivalued logic, and the set of operators which provide an internally unate circuit is described. For each code, modifications are provided to incorporate testing for primary input faults. Some area overhead evaluations are performed using benchmarks implemented on binary and quaternary programmable logic arrays
Keywords :
error detection codes; logic arrays; logic circuits; logic testing; many-valued logics; area overhead evaluations; benchmarks; binary PLAs; concurrent checking; multiple-valued circuits; multiple-valued logic circuits; operators; quaternary programmable logic arrays; testing; unateness; unidirectional error-detecting codes; unidirectional errors; Benchmark testing; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Logic circuits; Logic testing; Performance evaluation; Programmable logic arrays; Very large scale integration;
Conference_Titel :
Multiple-Valued Logic, 1992. Proceedings., Twenty-Second International Symposium on
Conference_Location :
Sendai
Print_ISBN :
0-8186-2680-1
DOI :
10.1109/ISMVL.1992.186791
