• DocumentCode
    2910646
  • Title

    VERISEC: verifying equivalence of sequential circuits using SAT

  • Author

    Syal, Manan ; Hsiao, Michael S.

  • Author_Institution
    Bradley Dept. of Electr. & Comput. Eng., Virginia Tech, Blacksburg, VA, USA
  • fYear
    2005
  • fDate
    30 Nov.-2 Dec. 2005
  • Firstpage
    52
  • Lastpage
    59
  • Abstract
    In this paper we propose a framework to verify equivalence of sequential circuits using Boolean satisfiability (SAT). We tackle a problem that is harder than the traditional sequential hardware equivalence; specifically, we address the uninvestigated problem of verifying delay replaceability as stated in V. Singhal et al. (2001) of two sequential designs. This notion of sequential equivalence does not make any assumptions either about the design-environment or about the design´s steady state behavior. Thus, verifying delay replaceability is considered as hard as verifying safe replaceability according to V. Singhal et al. (2001) of sequential circuits (conjectured as EXPSPACE complete). Our SAT-based framework has the following salient features: (a) a methodology to inductively prove equivalence (delay replaceability) of sequential circuits with no assumptions about any initial state; (b) a scheme to include sequential logic implications into the framework; and (c) a low-cost scheme to identify equivalent flip-flop pairs on the fly. We used our tool to successfully verify several sequential benchmark circuits. Low execution times make our framework practical and scalable.
  • Keywords
    Boolean functions; computability; equivalence classes; formal verification; logic testing; sequential circuits; Boolean satisfiability; VERISEC technique; delay replaceability; equivalence verification; low-cost scheme; sequential circuits; sequential equivalence; sequential logic; steady state behavior; Benchmark testing; Circuit synthesis; Circuit testing; Constraint optimization; Delay; Flip-flops; Hardware; Sequential circuits; Signal generators; Steady-state;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    High-Level Design Validation and Test Workshop, 2005. Tenth IEEE International
  • ISSN
    1552-6674
  • Print_ISBN
    0-7803-9571-9
  • Type

    conf

  • DOI
    10.1109/HLDVT.2005.1568813
  • Filename
    1568813