DocumentCode
2910646
Title
VERISEC: verifying equivalence of sequential circuits using SAT
Author
Syal, Manan ; Hsiao, Michael S.
Author_Institution
Bradley Dept. of Electr. & Comput. Eng., Virginia Tech, Blacksburg, VA, USA
fYear
2005
fDate
30 Nov.-2 Dec. 2005
Firstpage
52
Lastpage
59
Abstract
In this paper we propose a framework to verify equivalence of sequential circuits using Boolean satisfiability (SAT). We tackle a problem that is harder than the traditional sequential hardware equivalence; specifically, we address the uninvestigated problem of verifying delay replaceability as stated in V. Singhal et al. (2001) of two sequential designs. This notion of sequential equivalence does not make any assumptions either about the design-environment or about the design´s steady state behavior. Thus, verifying delay replaceability is considered as hard as verifying safe replaceability according to V. Singhal et al. (2001) of sequential circuits (conjectured as EXPSPACE complete). Our SAT-based framework has the following salient features: (a) a methodology to inductively prove equivalence (delay replaceability) of sequential circuits with no assumptions about any initial state; (b) a scheme to include sequential logic implications into the framework; and (c) a low-cost scheme to identify equivalent flip-flop pairs on the fly. We used our tool to successfully verify several sequential benchmark circuits. Low execution times make our framework practical and scalable.
Keywords
Boolean functions; computability; equivalence classes; formal verification; logic testing; sequential circuits; Boolean satisfiability; VERISEC technique; delay replaceability; equivalence verification; low-cost scheme; sequential circuits; sequential equivalence; sequential logic; steady state behavior; Benchmark testing; Circuit synthesis; Circuit testing; Constraint optimization; Delay; Flip-flops; Hardware; Sequential circuits; Signal generators; Steady-state;
fLanguage
English
Publisher
ieee
Conference_Titel
High-Level Design Validation and Test Workshop, 2005. Tenth IEEE International
ISSN
1552-6674
Print_ISBN
0-7803-9571-9
Type
conf
DOI
10.1109/HLDVT.2005.1568813
Filename
1568813
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