DocumentCode :
2910830
Title :
Reuse in system-level stimuli-generation
Author :
Katz, Yoav ; Jaeger, Itai ; Emek, Roy ; Lichtenstein, Yossi ; Devadason, Anita ; Romonosky, Audrey
Author_Institution :
IBM Res. Lab, Haifa, Israel
fYear :
2005
fDate :
30 Nov.-2 Dec. 2005
Firstpage :
105
Lastpage :
111
Abstract :
This paper reports on the verification models of twelve systems including servers and advanced processors. We focus on system-level stimuli generation and study reuse in subsequent system models. The paper describes our modeling framework, where systems are modeled mainly by declarative constructs with some procedural code. Separate test specifications are used to direct stimuli generation, but are not studied in this paper. We find that a high level of white-box reuse reduces costs and allows starting the verification process early. This result reflects gradual evolution of the systems we study and the effectiveness of the declarative modeling scheme. We discuss the possible influence of libraries of system-level constructs on reuse in languages such ´e´ Vera, and SystemVerilog.
Keywords :
automatic test pattern generation; formal verification; logic CAD; logic simulation; logic testing; declarative constructs; declarative modeling scheme; direct stimuli generation; functional verification; procedural codes; system verification; system-level constructs; system-level stimuli-generation; test specifications; verification models; white-box reuse; Computer bugs; Costs; Design engineering; Intellectual property; Libraries; Logic design; Object oriented modeling; Silicon; System testing; System-on-a-chip;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
High-Level Design Validation and Test Workshop, 2005. Tenth IEEE International
ISSN :
1552-6674
Print_ISBN :
0-7803-9571-9
Type :
conf
DOI :
10.1109/HLDVT.2005.1568822
Filename :
1568822
Link To Document :
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