Title :
On post-decision symbol-reliability generation
Author :
Seshadri, N. ; Hoeher, P.
Author_Institution :
AT&T Bell Lab., Murray Hill, NJ, USA
Abstract :
A post-processor for providing reliability information about every decoded data symbol at the output of an arbitrary decoder is proposed. This reliability information is generated by comparing the decoded sequence to a small list of alternative sequences which differ from the decoded sequence at least in the symbol for which the reliability is being evaluated. It is shown that this algorithm is a simplification of the optimal symbol-by-symbol detector (OSSD). The performance of the proposed algorithm is demonstrated by considering three concatenated coding systems
Keywords :
concatenated codes; decoding; reliability; sequences; algorithm; alternative sequences; concatenated coding systems; decoder; optimal symbol-by-symbol detector; performance; post-decision symbol-reliability generation; post-processor; Concatenated codes; Decoding; Delay; Detectors; Fading; Gain; Signal generators; Signal processing algorithms; State-space methods; Viterbi algorithm;
Conference_Titel :
Communications, 1993. ICC '93 Geneva. Technical Program, Conference Record, IEEE International Conference on
Conference_Location :
Geneva
Print_ISBN :
0-7803-0950-2
DOI :
10.1109/ICC.1993.397372
