DocumentCode
2911098
Title
Characterization of Single- and Multi-walled Carbon Nanotubes at Microwave Frequencies
Author
Al Moayed, N.N. ; Khan, U.A. ; Obol, M. ; Gupta, S. ; Afsar, M.N.
Author_Institution
Tufts Univ., Medford
fYear
2007
fDate
1-3 May 2007
Firstpage
1
Lastpage
4
Abstract
The present paper reports the first step towards detecting and characterizing both the single-and multi walled carbon nanotubes using microwave frequencies. The dielectric properties for these nanostructured carbon materials are measured using the rectangular waveguide technique and are determined in the frequency regime ranging 8-40 GHz. The data is represented in terms of dielectric constants and both real and imaginary parts of permittivity and permeability. These results represents a milestone in such measurements for carbon nanotube structures serving as a model such that it covers a wide frequency range using an efficient, non-invasive and highly accurate technique that is ideal for high frequency characterization for a variety of nanoscale materials.
Keywords
carbon nanotubes; dielectric properties; microwave measurement; nanostructured materials; permeability; permittivity measurement; rectangular waveguides; absorbing media; carbon nanotube structures; conductivity measurement; dielectric constants; dielectric measurement; dielectric properties; frequency 8 GHz to 40 GHz; microwave frequencies; multiwalled carbon nanotubes; nanoscale materials; nanostructured carbon materials; permeability; permittivity measurement; rectangular waveguide; single-walled carbon nanotubes; Carbon nanotubes; Dielectric constant; Dielectric materials; Dielectric measurements; Frequency measurement; Microwave frequencies; Nanostructured materials; Organic materials; Permittivity measurement; Rectangular waveguides; Absorbing media; conductivity; conductivity measurements; dielectric and permeability measurements; microwave frequency; nanoscale materials; nanotechnology; waveguides;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference Proceedings, 2007. IMTC 2007. IEEE
Conference_Location
Warsaw
ISSN
1091-5281
Print_ISBN
1-4244-0588-2
Type
conf
DOI
10.1109/IMTC.2007.379077
Filename
4258227
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