DocumentCode :
2911577
Title :
A Simple Algorithm for Solving a Two-dimensional Nonlinear Measurement Problem
Author :
Domanski, W. ; Zakrzewski, J.
Author_Institution :
Silesian Univ. of Technol., Gliwice
fYear :
2007
fDate :
1-3 May 2007
Firstpage :
1
Lastpage :
5
Abstract :
The term "two-dimensional measurements" is related to the cases when two sensors used in measuring system are nonselective and by the appropriate processing of the sensors output signals we wish to extract the values of both measured variables. The processing becomes complicated when the sensors are nonlinear and the number of available calibrating points is limited. The paper presents a relatively simple algorithm applicable even in simple microprocessor systems. The algorithm consists in the successive, step-by-step, narrowing the permissible range of measured variables. The results of simulative calculations based on the real data are presented in the form of the error maps.
Keywords :
calibration; microprocessor chips; sensors; calibrating points; microprocessor systems; sensors output signals; two-dimensional nonlinear measurement problem; Appropriate technology; Calibration; Chemical sensors; Electric variables measurement; Equations; Microprocessors; Sensor arrays; Sensor systems; Signal processing; Signal processing algorithms; algorithms for microprocessor instruments; non-selective sensors; two-dimensional measurements;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference Proceedings, 2007. IMTC 2007. IEEE
Conference_Location :
Warsaw
ISSN :
1091-5281
Print_ISBN :
1-4244-0588-2
Type :
conf
DOI :
10.1109/IMTC.2007.379239
Filename :
4258256
Link To Document :
بازگشت