DocumentCode
2911577
Title
A Simple Algorithm for Solving a Two-dimensional Nonlinear Measurement Problem
Author
Domanski, W. ; Zakrzewski, J.
Author_Institution
Silesian Univ. of Technol., Gliwice
fYear
2007
fDate
1-3 May 2007
Firstpage
1
Lastpage
5
Abstract
The term "two-dimensional measurements" is related to the cases when two sensors used in measuring system are nonselective and by the appropriate processing of the sensors output signals we wish to extract the values of both measured variables. The processing becomes complicated when the sensors are nonlinear and the number of available calibrating points is limited. The paper presents a relatively simple algorithm applicable even in simple microprocessor systems. The algorithm consists in the successive, step-by-step, narrowing the permissible range of measured variables. The results of simulative calculations based on the real data are presented in the form of the error maps.
Keywords
calibration; microprocessor chips; sensors; calibrating points; microprocessor systems; sensors output signals; two-dimensional nonlinear measurement problem; Appropriate technology; Calibration; Chemical sensors; Electric variables measurement; Equations; Microprocessors; Sensor arrays; Sensor systems; Signal processing; Signal processing algorithms; algorithms for microprocessor instruments; non-selective sensors; two-dimensional measurements;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference Proceedings, 2007. IMTC 2007. IEEE
Conference_Location
Warsaw
ISSN
1091-5281
Print_ISBN
1-4244-0588-2
Type
conf
DOI
10.1109/IMTC.2007.379239
Filename
4258256
Link To Document