Title :
An Efficient Method for Computation of Signatures
Author :
See, Chin-Foo ; Saluja, Kewal K.
Author_Institution :
Asia Peripheral Division, Hewlett Packard Singapore (Pte) Ltd.
Keywords :
Asia; Circuit faults; Circuit simulation; Circuit testing; Compaction; Computer errors; Cyclic redundancy check; Digital circuits; Linear feedback shift registers; Polynomials;
Conference_Titel :
VLSI Design, 1992. Proceedings., The Fifth International Conference on
Print_ISBN :
0-8186-2465-5
DOI :
10.1109/ICVD.1992.658055