DocumentCode
2912014
Title
New electro-optic sensor architecture for temperature measurements
Author
Claverie, Rémy ; Salvestrini, J.P. ; Fontana, M.D.
Author_Institution
Univ. Paul Verlaine, Metz
fYear
2007
fDate
1-3 May 2007
Firstpage
1
Lastpage
3
Abstract
The authors show in this paper, the first results on the feasibility of a new electro-optic sensor architecture used for temperature measurements. This sensor is based on the birefringent variation of an optical material. This phenomena is well-known and often exploited for electric field measurements (Kuo et al., 2000, Cecelja et al., 2002) or temperature measurements (Jeon & Kim, 2004). All these sensors use the refractive index variation induced on a crystal placed into a polarimetric setup. Optical intensities variations due to temperature variation enable to determine the value of the temperature. Nevertheless, for most of the authors, the electronic part of these sensors in not the main interest, thatpsilas why, the optical part was described and the authors focused on the electronic instrumentation of this sensor. This one is based on an electronic detector which remains its output directly proportionnal to the temperature variation (Claverie et al., 2006). The temperature value is obtained by a control of the static intensity at a specific operating point of the transmittance. The results show that this architecture offers a high linearity and has a short response time (50ms).
Keywords
electro-optical devices; temperature measurement; temperature sensors; electronic detector; electronic instrumentation; electrooptic sensor architecture; optical material birefringent variation; optical part; polarimetric setup; refractive index variation; temperature measurement; Birefringence; Electric variables measurement; Electrooptic devices; Optical materials; Optical refraction; Optical sensors; Optical variables control; Sensor phenomena and characterization; Temperature measurement; Temperature sensors;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference Proceedings, 2007. IMTC 2007. IEEE
Conference_Location
Warsaw
ISSN
1091-5281
Print_ISBN
1-4244-0588-2
Type
conf
DOI
10.1109/IMTC.2007.379324
Filename
4258283
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