DocumentCode :
291266
Title :
Study and characterization of photosensitive cells in ASICs
Author :
Goujou, E. ; Gorria, P. ; Fauvet, E. ; Robert, M. ; Cathebras, G.
Author_Institution :
Lab. G.E.R.E., Bourgogne Univ., Le Creusot, France
Volume :
2
fYear :
1994
fDate :
5-9 Sep 1994
Firstpage :
911
Abstract :
This paper describes a full custom ASIC realization of different kinds of photosensitive cells in a CMOS 1.2 μm and two levels of metal technology which is normally used for the design of digital data processing architectures (ES2). Each cell is directly controlled by a MOS transistor and the photocurrent produced by a luminous flux can be modulated by applying an appropriate gate voltage. The objective of the study and characterization of such cells is to design a array of photosensitive cells where a current directly proportional to the incident luminous flux is produced for each cell. Besides the integration time, or exposure time, and the instant the electrical information is read are different for each cell (or pixel) and independent of its location in the array. The authors first present the results obtained by a static study (e.g. under a constant luminous flux) before discussing the dynamic analysis where the discharge of the photodiode capacitor has been studied as a function of the luminous flux, the integration time and the reading moment. Moreover, the active surface area as well as the design techniques are also been considered in the authors´ comparison criteria
Keywords :
CMOS integrated circuits; application specific integrated circuits; photodiodes; CMOS 1.2 μm; MOS transistor; active surface area; full custom ASIC; gate voltage; luminous flux; metal technology; photocurrent; photosensitive cells; Application specific integrated circuits; CMOS process; CMOS technology; Capacitors; Data processing; Fault location; MOSFETs; Photoconductivity; Photodiodes; Voltage control;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Electronics, Control and Instrumentation, 1994. IECON '94., 20th International Conference on
Conference_Location :
Bologna
Print_ISBN :
0-7803-1328-3
Type :
conf
DOI :
10.1109/IECON.1994.397909
Filename :
397909
Link To Document :
بازگشت